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HOME >> Instrument & Meters >> NDT devices >> Integrated Instrument >> smart-2005 intelligent ET/MMT/UT tester
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smart-2005 intelligent ET/MMT/UT tester

smart-2005 intelligent ET/MMT/UT tester

SMART-2005 Intelligent ET MMT UT Tester is a new generation NDT instrument with powerful functions, leading technology and good expansibility. It has advanced technologies and functions such as array eddy current detection, magnetic memory multi-channel testing, magnetic leakage and so on. The 80M high-speed sampling UT function uses 12 bit AD, DSP digital processing technology, SMT process technology, EEC SMART-2005. It is a multifunctional tester.

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商品描述

SMART-2005 Intelligent ET MMT UT Tester is a new generation NDT instrument with powerful functions, leading technology and good expansibility. It has advanced technologies and functions such as array eddy current detection, magnetic memory multi-channel testing, magnetic leakage and so on. The 80M high-speed sampling UT function uses 12 bit AD, DSP digital processing technology, SMT process technology, EEC SMART-2005. It is a multifunctional tester.




It can be used in various industries and equipments powered by new lithium batteries. Users can choose TFT true color or electroluminescent high brightness EEC SMART display with modular organization of industrial computer, stable performance and high reliability. The device can provide powerful computing power, large screen display and high resolution, and storage of large test data. space

· Automatic/manual amplitude and phase measurements
· Impedance Plane and Strip Curve Display
· On-line operation hints, hotkeys help powerful: with eddy current / magnetic memory / magnetic leakage / far field / ultrasound and other detection functions
· Sensitivity and intuition: the location of metal defects can be determined immediately in the detection process.
· Data storage: eddy current testing parameters, graphics and files can be stored in the instrument and called at any time
· Data communication: It can communicate with desktop computer or similar instrument through network interface, transfer data of instrument parameters, graphics and files, and realize computer management of flaw detection results
· With functions of parameter, graph storage, playback and analysis
· Menu-based man-machine dialogue (Chinese and English version, Chinese complex/simple font optional), keyboard and mouse operation
· Array eddy current detection capability












Magnetic memory detecting
● Measurable channel: 8 channels
● Minimum measurable distance: 1mm
● Maximum measurable distance: 150mm
● Maximum scanning speed: 0.5m / Second
 
Eddy current/remote-field detection
● 2 frequency and 4 channel (Extendable to 8 frequencies) frequency range: 64Hz-5MHz (Remote field:5Hz~5KHz)
●Gain: 0-90dB，step length: 0.5 dB
●Automatically/manually measure amplitude and phase 
●Non-equal phase/amplitude alarming
●Array eddy current testing function and C-scan function
●Impedance plane and stripe curve displays
●Online operation, prompt with hotkey help
●Parameter, graphic data can be transferred between the same type equipment or with microcomputer
 
Magnetic Flux Leakage /low frequency electromagnetic detecting
● Channels: 8
● Gain: 0-90dB，with step length of 0.5 dB
● High-pass wave: 0~500Hz
● Low-pass wave:10Hz～10KHz
 
Ultrasonic  detecting
● Range of working frequency: 0.5M～20M
● Adjust gain: 0-120dB with step length of  0.5 dB（Hairbreadth: -1dB～3dB）  
● Demodulation way: positive/ negative, bi-direction and RF  
● Sampling precision: 12 bit AD    
● Sampling velocity: 80MHZ
● Pulse shift: -10～1000m/s (steel longitudinal wave)
● Zero point of probe:  0～200μS
● Sound velocity of Material:  1000～15000m/s    
● Testing range:  0～10000mm (steel longitudinal wave) Continue-adjustable, minimum display range : 1.0mm
● Suppress: -80% linear restrain
● Error of vertical linearity: ≤3％  
● Surplus sensitivity: ≥ 53dB                                                               
● DAC/TDG curve
● Measuring resolution:  0.03mm 
● Memory date: 1000 groups, 100 groups of parameters
 
Others technical standard
● Microprocessor: 16 bits
● Memorizer: 128M (Extendible to 2G) 
● Internal memory capacity: 16M
● TFT color screen/ High-light EL screen: EL 320x240
● Operating temperature: -25℃～＋60℃
● Internal power supply: 14.4V 4AH (rechargeable lithium battery)
● External power supply: AC 220V
● Graphics and parameter can be stored, replayed and analyzed
















It is especially suitable for flaw detection research in universities, scientific research, electric power, petrochemical, aerospace and other units.










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